资 源 简 介
Software developers use testing to raise confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the time required to detect faults during test suite execution. This package uses the Harrold Gupta Soffa, delayed greedy, traditional greedy, and 2-optimal greedy algorithms for both test suite reduction and prioritization. Even though reducing and reordering a test suite is primarily done to ensure that testing is cost-effective, these algorithms are normally configured to make greedy choices with coverage information alone. This package extends these algorithms to greedily reduce and prioritize the tests by using both test cost (e.g. execution time)and the ratio of code coverage to test cost. An empirical study with eight real world case study applications shows that the ratio greedy choice metric aids a test suite reduction method in identifying a smaller and faster test suite. The results also suggest that incorporati
文 件 列 表
DS
.classpath
.project
bin
src
GB
.classpath
.DS_Store
.project
bin
db
dbunit-2.1.jar
hsqldb
run_CT~
run_Normal~
run_RT~
src
JD
.classpath
.project
bin
src
LF
.classpath
.project
bin
src
test
RM
.classpath
.project
bin
db
run_CT~
run_Normal~
run_RT~
src
test
RP
.classpath
.project
bin
src
test
SCATTR
.DS_Store
bin
ccl.jar
data
doc
gen_graphs.R
gen_graphs.R~
GPL.txt
graphs
histo_translate.pl
histo_translate.pl~
javancss.jar
jhbasic.jar
README
sample
SCATTR.jar
src
temp.dat
Visualizer.R
Visualizer.R~
SK
.classpath
.project
src
test
TK
.classpath
.project
bin
src
TM
.classpath
.project
bin
src