数字存储器和混合信号超大规模集成电路
本书系统地介绍了数字、存储器和混合信号VLSI系统的测试和可测试性设计。该书是根据作者多年的科研成果和教学实践,结合国际上关注的最新研究热点并参考大量的文献撰写的。全书共分三个部分。第一部分是测试基础,介绍了测试基本概念、测试设备、测试经济学和故障模型。第二部分是测试方法,详细论述了组合和时序电路的测试生成、存储器测试、基于DSP和基于模块的模拟与混合信号测试、延迟测试和IDDQ测试等。第三部分是可测试性设计,包括扫描设计、BIST、边界扫描测试、模拟测试总线标准和基于IP芯核的SOC(System on a chip)测试。
SHOW FULL COLUMNS FROM `jrk_downrecords` [ RunTime:0.001964s ]
SELECT `a`.`aid`,`a`.`title`,`a`.`create_time`,`m`.`username` FROM `jrk_downrecords` `a` INNER JOIN `jrk_member` `m` ON `a`.`uid`=`m`.`id` WHERE `a`.`status` = 1 GROUP BY `a`.`aid` ORDER BY `a`.`create_time` DESC LIMIT 10 [ RunTime:0.093253s ]
SHOW FULL COLUMNS FROM `jrk_tagrecords` [ RunTime:0.001395s ]
SELECT * FROM `jrk_tagrecords` WHERE `status` = 1 ORDER BY `num` DESC LIMIT 20 [ RunTime:0.001378s ]
SHOW FULL COLUMNS FROM `jrk_member` [ RunTime:0.001155s ]
SELECT `id`,`username`,`userhead`,`usertime` FROM `jrk_member` WHERE `status` = 1 ORDER BY `usertime` DESC LIMIT 10 [ RunTime:0.003599s ]
SHOW FULL COLUMNS FROM `jrk_searchrecords` [ RunTime:0.001027s ]
SELECT * FROM `jrk_searchrecords` WHERE `status` = 1 ORDER BY `num` DESC LIMIT 5 [ RunTime:0.004169s ]
SELECT aid,title,count(aid) as c FROM `jrk_downrecords` GROUP BY `aid` ORDER BY `c` DESC LIMIT 10 [ RunTime:0.019610s ]
SHOW FULL COLUMNS FROM `jrk_articles` [ RunTime:0.001457s ]
UPDATE `jrk_articles` SET `hits` = 2 WHERE `id` = 458160 [ RunTime:0.017141s ]